面向复杂电磁环境的容错电路系统设计技术

张峻宾; 蔡金燕; 孟亚峰

doi:10.7652/xjtuxb201702009

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面向复杂电磁环境的容错电路系统设计技术

更新时间：2025-07-09

- 面向复杂电磁环境的容错电路系统设计技术
- A Design Technology of Fault Tolerance Circuit Systems Facing Complex Electromagnetic Environments
- 西安交通大学学报 2017年51卷第2期页码：53-59
- 作者机构：
  
  军械工程学院电子与光学工程系,石家庄,050003
- 作者简介：
- 基金信息：
  
  : 2016-09-18。作者简介: 张峻宾(1987—),男,博士生;蔡金燕(通信作者),女,教授,博士生导师。基金项目: 国家自然科学基金资助项目(61271153,61372039,61601495)
- DOI：10.7652/xjtuxb201702009
  中图分类号： TP302.8
- 网络首发：2017-02-10，
  
  纸质出版：2017
- 稿件说明：
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张峻宾, 蔡金燕, 孟亚峰. 面向复杂电磁环境的容错电路系统设计技术[J]. 西安交通大学学报, 2017,51(2):53-59.

A Design Technology of Fault Tolerance Circuit Systems Facing Complex Electromagnetic Environments[J]. 2017, 51(2): 53-59.
张峻宾, 蔡金燕, 孟亚峰. 面向复杂电磁环境的容错电路系统设计技术[J]. 西安交通大学学报, 2017,51(2):53-59. DOI： 10.7652/xjtuxb201702009.

A Design Technology of Fault Tolerance Circuit Systems Facing Complex Electromagnetic Environments[J]. 2017, 51(2): 53-59. DOI： 10.7652/xjtuxb201702009.

摘要

为解决复杂电磁环境中冗余容错电路系统容错形式单一、容错能力有限、冗余单元利用不充分和可靠性低等问题

提出了一种新颖的交互式-协同故障容错(ICFT)技术。根据整个电路系统预期输出信号

利用硬件本身冗余无故障单元替换故障单元。结合硬件演化(EHW)和补偿平衡技术(RBT)

当冗余无故障单元不足时

采用被动式ICFT技术对既有故障实现容错。当采用被动式ICFT技术失败时

采用主动式ICFT技术

通过注入故障并重新分配子电路功能实现容错。仿真结果表明:与常规冗余容错(CRFT)和硬件演化(EHW)相结合的技术CRFT-EHW相比

采用ICFT技术能够容忍的工作电路最大故障单元累积量为41个

远大于采用CRFT-EHW技术时的16个。

Abstract

A novel design technology for fault tolerance circuit systems based on interactive-collaborative fault tolerance(ICFT)technology is proposed to solve the problems that the redundant fault tolerance circuit systems have single fault tolerance form

their fault tolerance ability is limited

the use of redundant units is insufficient

and the reliability is low in complex electromagnetic environment. Fault units are replaced by redundant trouble-free units according to the expected output signals of the whole circuit system. When there are not enough redundant trouble-free units

the evolvable hardware(EHW)and the reparation balance technology(RBT)are combined

and then the passive-ICFT technology is used to achieve fault tolerance for existing fault. The active-ICFT is used only when the passive-ICFT fails

and then sub-circuit functions are redistributed. Simulation results show that the max faults units cumulative of working circuit of ICFT technology are forty-one

which are far greater than sixteen of conventional redundant fault tolerance and EHW(CRFT-EHW)technology.

关键词

Keywords

references

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