西安交通大学仪器科学与技术学院,710049,西安
安徽北方微电子研究院有限公司,215163,江苏苏州
作者简介:侯宪阁(2001-),男,博士生;
张庆(通信作者),男,教授,博士生导师。
收稿:2025-12-03,
网络首发:2026-03-30,
纸质出版:2026-08-10
移动端阅览
侯宪阁, 黄艳辉, 周铭, 等. 高
HOU Xiange, HUANG Yanhui, ZHOU Ming, et al. Phase-Field Analysis Method for the Reliability of High-
侯宪阁, 黄艳辉, 周铭, 等. 高
HOU Xiange, HUANG Yanhui, ZHOU Ming, et al. Phase-Field Analysis Method for the Reliability of High-
针对高
g
值(
g
为重力加速度)微机电系统(MEMS)加速度传感器在极端冲击环境下的结构失效问题,提出了一种利用相场断裂模型的可靠性分析方法。该方法以相场断裂理论为基础,构建了包含失效形式识别、裂纹演化仿真、结构改进与再验证的可靠性分析流程。通过静力学与瞬态分析,并结合相场断裂模型,对裂纹萌生与扩展的微尺度过程进行了定量化与可视化表征,并与三维高
g
值冲击试验结果进行了对比验证。在此基础上,针对扭转梁根部的高应力集中区域提出了圆角改进设计,并通过静力、瞬态再分析以及相场断裂的对比验证,完成改进方案的抗断裂性能评估。研究结果表明:扭转梁根部存在显著的应力集中现象,是裂纹萌生与扩展的主导区域,由此揭示了应力集中与裂纹演化之间的关联。所提出的梁根圆角改进设计使应力集中降低了约18%,裂纹扩展延迟了约40%,从而提高了传感器在高
g
值冲击工况下的抗断裂可靠性。该研究为高
g
值MEMS加速度传感器的可靠性分析供了一种解决方案。
To address structural failures in high-
g
micro-electro-mechanical system (MEMS) accelerometers under extreme shock environments
a reliability analysis method using the phasefield fracture model was proposed. Based on phase-field fracture theory
a reliability analysis workflow encompassing failure mode identification
crack evolution simulation
structural improvement
and re-validation was established. The micro-scale processes of crack initiation and propagation were quantitatively and visually characterized through static and transient analyses combined with a phase-field fracture model. The numerical results were comparatively validated against three-dimensional high-
g
shock test result
s. On this basis
a fillet improvement design was proposed for the high stress concentration region at the torsion-beam root
and the fracture resistance of the improved scheme was evaluated via static and transient re-analysis together with phase-field fracture-based comparative validation. The results indicate that pronounced stress concentration at the torsion-beam root is the dominant region governing crack initiation and propagation
thereby revealing the relationship between stress concentration and crack evolution. The proposed beam-root fillet improvement design reduces stress concentration by approximately 18% and delays crack propagation by about 40%
thus improving the fracture resistance reliability of the sensor under high-
g
impact conditions. This study provides a feasible solution for the reliability analysis of high-
g
MEMS accelerometers.
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