X射线辐照下聚酰亚胺材料空间电荷分布特性的数值模拟

钟辉; 陈玉; 李志超; 王以宁; 侯潇涵; 王双; 刘鑫; 苏兆锋; 李进玺; 朱小锋

doi:10.7652/xjtuxb202606005

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X射线辐照下聚酰亚胺材料空间电荷分布特性的数值模拟

专题　聚酰亚胺辐射效应研究 | 更新时间：2026-06-12

- X射线辐照下聚酰亚胺材料空间电荷分布特性的数值模拟
- Numerical Simulation of Space Charge Distribution Characteristics of Polyimide Materials under X-Ray Irradiation
- 西安交通大学学报 2026年60卷第6期页码：64-74
- 作者机构：
  
  西安交通大学电气工程学院，710049，西安
  西北核技术研究所，710024，西安
  中国工程物理研究院电子工程研究所，621900，四川绵阳
- 作者简介：
  
  作者简介：钟辉（1998—），男，博士生；
  陈玉（通信作者），男，教授，博士生导师。
- 基金信息：
  
  国家重点研发计划资助项目(2022YFF0705600);强脉冲辐射环境模拟与效应全国重点实验室开放基金资助项目(NKLIPR2318);中央高校基本科研业务费专项资金资助项目(xzy022024067)
- DOI：10.7652/xjtuxb202606005
  中图分类号： TM215.1;O487
- 收稿：2025-09-23，
  
  纸质出版：2026-06-10
- 稿件说明：
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钟辉, 陈玉, 李志超, 等. X射线辐照下聚酰亚胺材料空间电荷分布特性的数值模拟[J]. 西安交通大学学报, 2026,60(6):64-74.

ZHONG Hui, CHEN Yu, LI Zhichao, et al. Numerical Simulation of Space Charge Distribution Characteristics of Polyimide Materials under X-Ray Irradiation[J]. Journal of Xi'an Jiaotong University, 2026, 60(6): 64-74.
钟辉, 陈玉, 李志超, 等. X射线辐照下聚酰亚胺材料空间电荷分布特性的数值模拟[J]. 西安交通大学学报, 2026,60(6):64-74. DOI： 10.7652/xjtuxb202606005.

ZHONG Hui, CHEN Yu, LI Zhichao, et al. Numerical Simulation of Space Charge Distribution Characteristics of Polyimide Materials under X-Ray Irradiation[J]. Journal of Xi'an Jiaotong University, 2026, 60(6): 64-74. DOI： 10.7652/xjtuxb202606005.

摘要

针对特种装备用聚酰亚胺材料在X射线辐射环境下，介电强度下降导致装备可靠性降低的问题，提出了改进的双极性载流子输运模型，分析聚酰亚胺在辐射环境下的载流子输运机制。通过在连续性方程的源项中添加载流子激发率，表征X射线辐照引起电子-空穴对的激发过程。基于偏微分方程组的高精度求解算法，在偏置电场强度为20～100 kV·mm

-1

和X射线辐射剂量率为0～10 Gy·s

-1

的条件下，开展聚酰亚胺空间电荷和总电流密度的数值模拟。研究结果表明：偏置电场与辐射剂量率越大，聚酰亚胺内部的空间电荷积累越多；在不同剂量率X射线的辐照作用下，积累电荷的极性由负极性转变为正极性，其电荷密度与剂量率成正相关，最高可达41.2 C·m

-3

；材料总电流密度随时间呈幂指数方式增长，随后趋于稳定；辐照作用下的该幂指数与辐射剂量率呈负相关，但均高于无辐照时的情况；无辐照条件下，随着偏置电场的增加，电流密度稳态值从1.1×10

-9

A·m

-2

增加至7.9×10

-8

A·m

-2

，并且该电流密度的稳态值和偏置电场存在分段的幂指数关系；在同一偏置电场下，电流密度与辐射剂量率成正比，随着辐射剂量率的增加，电流密度稳态值可增加至1.2×10

-5

A·m

-2

。该研究对介质材料X射线辐射效应的模拟提供了借鉴意义。

Abstract

To address reliability degradation of equipment due to reduced dielectric strength of polyimide materials used in special equipment under X-ray irradiation，an improved bipolar carrier transport model was developed to analyze the carrier transport mechanism of polyimide exposed to radiation.The carrier excitation rate was incorporated into the source term of the continuity equation to characterize electron-hole pair excitation process induced by X-ray irradiation.Using the high-precision solution algorithm of partial differential equations，numerical simulations of space charge and total current density of polyimide were performed under bias electric field intensities of 20-100 kV·mm

-1

and X-ray radiation dose rates of 0-10 Gy·s

-1

.The results showed that，larger bias electric fields and higher radiation dose rates led to greater space charge accumulation within the polyimide.Under X-ray irradiation at different dose rates，the polarity of the accumulated charge was observed to reverse from negative to positive，and the accumulated charge density was positively correlated with the dose rate，reaching a maximum of 41.2 C·m

-3

. The total current density of the polyimide materials was found to increase with time following a power-law relation before appro

aching a steady state；the power-law exponent under irradiation decreased with increasing dose rate but remained larger than that without irradiation.In the absence of irradiation，the steady-state value of current density grew from 1.1×10

-9

A·m

-2

to 7.9×10

-8

A·m

-2

as the bias electric field increased，and a segmented power-law exponent dependence between the steady-state value of current density and the bias electric field was identified.At a fixed bias electric field，the steady-state value of current density was proportional to the irradiation dose rate and could increase up to 1.2×10

-5

A·m

-2

as dose rate rose.The study provides a reference for the simulation of X-ray radiation effect on dielectric materials.

关键词

Keywords

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