直流开断工况下金属氧化压敏电阻冲击老化及失效特性研究

龙辰; 白云帆; 吴益飞; 吴翊; 纽春萍; 荣命哲

doi:10.7652/xjtuxb202509006

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直流开断工况下金属氧化压敏电阻冲击老化及失效特性研究

—————————————————————— | 更新时间：2025-09-11

- 直流开断工况下金属氧化压敏电阻冲击老化及失效特性研究
- Study on the Impulse Aging and Failure Characteristics of Metal Oxide Varistors under Direct Current Interruption Conditions
- 西安交通大学学报 2025年59卷第9期页码：53-64
- 作者机构：
  
  西安交通大学电气工程学院， 710049，西安
- 作者简介：
  
  龙辰（1997—），男，博士生
  吴益飞，男，教授，博士生导师。
- 基金信息：
  
  国家自然科学基金资助项目(52377158;52025074;U2241260)
- DOI：10.7652/xjtuxb202509006
  中图分类号： TM51
- 收稿：2025-02-21，
  
  网络首发：2025-05-15，
  
  纸质出版：2025-09-10
- 稿件说明：
移动端阅览
龙辰, 白云帆, 吴益飞, 等. 直流开断工况下金属氧化压敏电阻冲击老化及失效特性研究[J]. 西安交通大学学报, 2025,59(9):53-64.

LONG Chen, BAI Yunfan, WU Yifei, et al. Study on the Impulse Aging and Failure Characteristics of Metal Oxide Varistors under Direct Current Interruption Conditions[J]. Journal of Xi’an Jiaotong University, 2025, 59(9): 53-64.
龙辰, 白云帆, 吴益飞, 等. 直流开断工况下金属氧化压敏电阻冲击老化及失效特性研究[J]. 西安交通大学学报, 2025,59(9):53-64. DOI： 10.7652/xjtuxb202509006.

LONG Chen, BAI Yunfan, WU Yifei, et al. Study on the Impulse Aging and Failure Characteristics of Metal Oxide Varistors under Direct Current Interruption Conditions[J]. Journal of Xi’an Jiaotong University, 2025, 59(9): 53-64. DOI： 10.7652/xjtuxb202509006.

摘要

为了探究直流开断过程中金属氧化物压敏电阻（MOV）的老化及失效特性，搭建了MOV老化失效实验平台，研究了在重复脉冲作用下，MOV的阈值电压、泄漏电流、非线性系数以及残压的变化规律。研究发现，阈值电压

1mA

随冲击次数增多先上升后下降，整体变化不超过1%，泄漏电流

75%

随冲击次数增加接近线性增长，而非线性系数

随冲击次数增加逐步减小，且下降速度与冲击能量正相关，残压

res

变化小于5%。采用泄漏电流作为标准可以更直观地反映MOV的老化情况。通过分析不同能量下多次冲击后的MOV失效情况，建立了冲击能量与失效统计次数

50%

之间的关系。利用有限元仿真，建立了MOV失效模型，研究了微观晶粒中电流、温度及应力的分布规律以及失效阈值，并通过实验验证了失效模型的准确性。结果表明，模型在失效阈值预测方面的误差为8%，在各种能量冲击下的温度预测方面的误差均小于5%。

Abstract

To investigate the aging and failure characteristics of metal oxide varistors (MOVs) during DC interruption

this study establishes an experimental platform for MOV aging and failure. The changes in threshold voltage

leakage current

nonlinear coefficient

and residual voltage of MOVs under repeated pulse actions are examined. The finding reveals that the threshold voltage

1mA

initially increases and then decreases with the increase in the number of impacts

with an overall change of no more than 1%. The leakage current

75%

shows close to linear growth with an increasing number of impacts

while the nonlinear coe

fficient

gradually decreases as the number of impacts increases

with the rate of decrease positively correlated to the impact energy. The residual voltage

res

changes by less than 5%. Using leakage current as a standard can more intuitively reflect the aging condition of MOVs. By analyzing the failure conditions of MOVs after multiple impacts at different energy levels

a relationship between impact energy and the statistical failure count

50%

is established. A finite element simulation is used to develop a MOV failure model

investigating the distribution of current

temperature

and stress within microcrystals

as well as the failure threshold

with experimental validation of the model's accuracy. The results indicate that the prediction error for the failure threshold is 8%

and the prediction error for temperature under various energy impacts is less than 5%.

关键词

Keywords

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