采用虚拟样本加速退化试验的复杂电子设备可靠性评估

徐宇亮 1; 3; 陈西宏 1; 孙际哲 1; 刘瑞峰 2; 范浩 2

doi:10.7652/xjtuxb201306014

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采用虚拟样本加速退化试验的复杂电子设备可靠性评估

更新时间：2025-05-01

- 采用虚拟样本加速退化试验的复杂电子设备可靠性评估
- Reliability Assessment for Complicated Electronic Equipment with Virtual Samples of Accelerated Degradation Tests
- 西安交通大学学报 2013年47卷第6期页码：79-84
- 作者机构：
  
  1. 空军工程大学防空反导学院,西安,710051
  2. 中国人民解放军93655部队,北京,101500
- 作者简介：
- 基金信息：
  
  : 2012-08-28。作者简介: 徐宇亮(1984—),男,博士生;孙际哲(通信作者),男,教授,博士生导师。基金项目: 国家自然科学基金资助项目(60971118)
- DOI：10.7652/xjtuxb201306014
  中图分类号： V442;TP277
- 网络首发：2013-06-10，
  
  纸质出版：2013
- 稿件说明：
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徐宇亮 1, 3, 陈西宏 1, 等. 采用虚拟样本加速退化试验的复杂电子设备可靠性评估[J]. 西安交通大学学报, 2013,47(6):79-84.

Reliability Assessment for Complicated Electronic Equipment with Virtual Samples of Accelerated Degradation Tests[J]. 2013, 47(6): 79-84.
徐宇亮 1, 3, 陈西宏 1, 等. 采用虚拟样本加速退化试验的复杂电子设备可靠性评估[J]. 西安交通大学学报, 2013,47(6):79-84. DOI： 10.7652/xjtuxb201306014.

Reliability Assessment for Complicated Electronic Equipment with Virtual Samples of Accelerated Degradation Tests[J]. 2013, 47(6): 79-84. DOI： 10.7652/xjtuxb201306014.

摘要

对复杂电子设备进行可靠性评估时

针对退化特征量难以确定和试验样本数目有限这两方面的困难

提出了一种基于虚拟样本加速退化试验(ADT)的电子设备可靠性评估新方法。将相对贴近度的概念引入到退化监测数据的处理中

以相对贴近度为退化特征量

并对原始样本进行虚拟增广

同时对增广样本数据加以修正处理

从而形成电子设备各应力下的退化轨迹。将该方法与传统的可靠性预测方法相结合

有效地解决了加速退化试验中极少样本数据的处理问题。实例分析表明:电子设备的预测寿命与出厂时标定使用寿命的误差为5.93%

86.27%的样品设备使用寿命超过9 a

说明该方法可行、有效

并大大提高了试验的效费比。

Abstract

For the reliability assessment of complicated electronic equipment

the thimbleful testing samples and the degradation characters data recognition become the main focuses. Thus

a new approach based on accelerated degradation tests of virtual samples is proposed. Relative nearness degree is introduced for degradation dada process

and the degradation characters data are represented by the relative nearness degree

then the original samples are expanded virtually and modified

and the degradation track of electronic equipment under various stresses is obtained. Combining the traditional reliability prediction

the difficulty of thimbleful testing sample is solved in the accelerated degradation tests. Example analysis shows that the error of the life prediction of a kind of electronic equipment is 5.93% by contrast with the factory calibrating error of service life

and the predicted service life of 86.27% samples is more than nine years

which indicates validity and higher ratio of efficiency to cost of the proposed method.

关键词

Keywords

references

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