1. 中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室,西安,710119
2. 西安交通大学电子物理与器件教育部重点实验室,西安,710049
3. 西安交通大学陕西省信息光子技术重点实验室,西安,710049
网络首发:2011-02-10,
纸质出版:2011
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张稳稳 1, 吴朝新 2, 朱仁龙 2, 等. 有机电致发光器件稳定性测试系统的设计与实现[J]. 西安交通大学学报, 2011,45(2):64-67+72.
Development of Testing System for the Stability of Organic Light Emitting Devices[J]. 2011, 45(2): 64-67+72.
针对目前有机电致发光器件的稳定性测试系统电路复杂和成本较高等问题
设计了一种有机电致发光器件稳定性测试系统.该系统采用集成运放组建器件的驱动电源
用硅光电池俘获亮度值
并选用基于PCI总线的采集卡来采集亮度数据和电压数据.该稳定性测试系统不仅能够提供常用的恒流驱动方式
而且可以提供一种电流-电压混合源(正向恒流反向恒压)驱动.由于采用硅光电池代替传统的辉度计
因此大幅度节约了成本; 基于PCI总线的采集卡的选择
降低了开发设计的难杂程度
缩短了开发周期.测试结果表明
该系统能够测试不同样品的亮度衰减和电压上升情况
性能稳定
数据可靠.
A novel testing system for stability of organic light emitting devices(OLED)is proposed to improve the circuital complexity and high cost of existing systems. The proposed system employs the high precision IC operational amplifiers to achieve driving power supply
and uses silicon photocells to capture brightness of OLED. Then an acquisition board based on PCI bus is used to obtain the data concerning the variation of brightness and voltage of OLED. The testing system can provide two different power sources
i.e.
a constant current source and a hybrid current-voltage source(a constant current source for direct bias and a constant voltage source for reverse bias). Silicon photocells are used to replace traditional brightness photometers so that costs are substantially reduced
while the use of the acquisition board based on PCI bus decreases development difficulty and shortens the development time. Testing results show that the system is competent to measure luminance delay and voltage raising
and is stable and reliable.
ISHII M, TAGA Y. Influence of temperature and drive current on degradation mechanisms in organic light diodes [J].Applied Physics Letters, 2002, 80(18):3430-3432.
AZIZ H, POPVIC Z D, HU Nanxing, et al. Degradation mechanism of small molecule-based organic light-emitting devices [J].Science, 1999 283(19):1990-1902.
倪抒颖,吴有智,孙润光,等. 有机电致发光器件自动测量系统 [J].上海大学学报:自然科学版, 2004, 10(4):337-340,345.
NI Shuying, WU Youzhi, SUN Runguang, et al.Automatic measurement system for organic light emitting diodes(OLEDs)[J]. Journal of Shanghai University: Natural Science, 2004, 10(4):337-340,345.
彭强,姚若河.新型OLED测试系统的设计与实现 [J]. 半导体技术,2009,34(5):467-469.
PENG Qiang, YAO Ruohe. Design and implementation of novel OLED test system [J].Semiconductor Technology, 2009, 34(5):467-469.
JUAN C J, TSAI M J. Implementation of a novel system for measuring the lifetime of OLED panels [J]. IEEE Consume Electronics, 2003, 49(1):1-2.
陈志明,朱文清,张志林,等. 有机电致发光器件寿命测试系统 [J]. 光电子•激光, 2006, 17(1):1349-1350.
CHEN Zhiming, ZHU Wenqing, ZHANG Zhilin, et al. Life test system of organic light-emitting devices [J]. Journal of Optoelectronics•Laser, 2006, 17(1):1349-1350.
FERY C, RACINE B, VAUFREY D, et al. Physical mechanism responsible for the stretched exponential decay behavior of aging organic light-emitting diodes[J/OL]. Applied Physics Letters, 2005, 87(21)[2010-05-23]. http:∥scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdfid=APPLAB000087000021213502000001idtype=cvipsprog=normaldoi=10.1063/1.2133922.
VAN VANSLYKE S A, CHEN Chin Hsin, TANG Ching Wan. Organic electroluminescent devices with improved stability [J]. Applied Physics Letters, 1996, 69(15):2160-2162.
BEAUDOIN N, ESSIAMBRE S, GAUVIN S. Simple hybrid current-voltage source for the characterization of organic light-emitting devices [J/OL]. Review of Scientific Instruments, 2006, 77(2)[2010-05-15]. http:∥scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdfid=RSINAK000077000002026102000001idtype=cvipsprog=normaldoi=10.1063/1.2169502.
LI Feng, FENG Jing, LIU Shiyong. Degradation of organic light-emitting devices under different driving model [J]. Synthetic Metals, 2003, 137(1/2/3):1103-1104.
CUSUMANO P, BUTTITTA F, DI CRISTOFALO A, et al. Effect of driving method on the degradation of organic light emitting diodes [J]. Synthetic Metals, 2003, 139(3):657-661.
ZOU Dechun, YAHIRO M, TSUTSUI T. Spontaneous and reverse-bias induced recovery behavior in organic electroluminescent diodes [J]. Applied Physics Letters, 1998, 72(19):2484-2486.
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