厚样品电子断层成像中的电子透过率非线性效应

曹猛; 李瀛台; 张海波; 王芳

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厚样品电子断层成像中的电子透过率非线性效应

更新时间：2025-07-09

- 厚样品电子断层成像中的电子透过率非线性效应
- The Nonlinear Effect of Electron Transmission in Electron Tomography for Thick Specimens
- 西安交通大学学报 2011年45卷第6期页码：50-54
- 作者机构：
  
  西安交通大学电子物理与器件教育部重点实验室,西安,710049
- 作者简介：
- 基金信息：
  
  : 2011-01-21. 作者简介: 曹猛(1976-),男,博士,讲师. 基金项目: 教育部高等学校博士学科点专项科研基金资助项目(20070698013);陕西省自然科学基金基础研究计划资助项目(2009JQ8001);中央高校基本科研业务费专项资金资助项目
- DOI：
  中图分类号： O463;TN16
- 网络首发：2011-06-10，
  
  纸质出版：2011
- 稿件说明：
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曹猛, 李瀛台, 张海波, 等. 厚样品电子断层成像中的电子透过率非线性效应[J]. 西安交通大学学报, 2011,45(6):50-54.

The Nonlinear Effect of Electron Transmission in Electron Tomography for Thick Specimens[J]. 2011, 45(6): 50-54.
曹猛, 李瀛台, 张海波, 等. 厚样品电子断层成像中的电子透过率非线性效应[J]. 西安交通大学学报, 2011,45(6):50-54. DOI：

The Nonlinear Effect of Electron Transmission in Electron Tomography for Thick Specimens[J]. 2011, 45(6): 50-54. DOI：

摘要

为提高透射电子显微术中厚样品电子断层成像的质量

研究了电子透过率与样品质量厚度之间的非线性关系对厚样品电子断层成像的影响.在微米量级厚样品电子透过率实测结果的基础上

通过计算机模拟生成系列投影像并进行了图像重构.模拟结果表明

电子透过率的非线性会在重构结果中产生伪结构

投影值偏离量随投影位置的变化率与伪结构相关.进一步评价了样品在不同倾斜角度范围时电子的非线性透过率对图像重构质量的影响

发现这种影响随样品倾斜角度增大而增强

并有可能降低图像重构的质量.

Abstract

Nonlinear effects between electron transmission and mass thickness on the quality of electron tomography(ET)for thick specimens are studied to improve the quality of the ET for thick specimens in transmission electron microscopy. A series of projections are produced by simulation and then used to reconstruct images based on electron transmission through the microns-thick specimens. It is found from simulation that artifacts due to nonlinearity exist in the reconstruction result. The artifacts are relevant to the gradient deviation of projection with respect to the projection position. Moreover

effects of nonlinear electron transmission in different tilt angle ranges on reconstruction quality are investigated

and it is found that increasing tilt angle can enhance the effect of nonlinearity and reduce the quality of reconstructed images.

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references

MIDGLEY P A, DUNIN-BORKOWSKI R E. Electron tomography and holography in materials science [J]. Nature Materials, 2009, 8(4): 271-280.

ANDERSSON B V, HERLAND A, MASICH S, et al. Imaging of the 3D nanostructure of a polymer solar cell by electron tomography [J]. Nano Letters, 2009, 9(2): 853-855.

YUAN Pei, ZHOU Xufeng, WANG Hongning, et al. Electron-tomography determination of the packing structure of macroporous ordered siliceous foams assembled from vesicles [J]. Small, 2009, 5(3): 377-382.

URBAN E, JACOB S, NEMETHOVA M, et al. Electron tomography reveals unbranched networks of actin filaments in lamellipodia [J]. Nature Cell Biology, 2010, 12(5): 429-436.

TAKAOKA A, HASEGAWA T, YOSHIDA K, et al. Microscopic tomography with ultra-HVEM and applications [J]. Ultramicroscopy, 2008, 108(3): 230-238.

KAMIOKA H, MURSHID S A, ISHIHARA Y, et al. A method for observing silver-stained osteocytes in situ in 3-μm sections using ultra-high voltage electron microscopy tomography [J]. Microscopy and Microanalysis, 2009, 15(5): 377-383.

AOYAMA K, TAKAGI T, HIRASE A, et al. STEM tomography for thick biological specimens [J]. Ultramicroscopy, 2008, 109(1): 70-80.

WANG Fang, ZHANG Haibo, CAO Meng, et al. Image quality of microns-thick specimens in the ultra-high voltage electron microscope [J]. Micron, 2010, 41(5): 490-497.

杨超, 张海波, 鹰冈昭夫. 电子显微镜成像质量与样品倾斜角度关系的数值化评价 [J]. 西安交通大学学报, 2003, 37(10): 1063-1066.

YANG Chao, ZHANG Haibo, TAKAOKA A. Quanitative relationship between transmission electron microscopy image quality and specimen tilt angle [J]. Journal of Xi'an Jiaotong University, 2003, 37(10): 1063-1066.

ZHANG Haibo, WANG Fang, TAKAOKA A. Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope [J]. Journal of Electron Microscopy, 2007, 56(2): 51-55.

FULTZ B, HOWE J M. Transmission electron microscopy and diffractometry of materials [M]. 3rd ed. Berlin, Germany: Springer, 2008.

ZHANG Haibo, ZHANG Xiangliang, WANG Yong, et al. Tomography experiment of an integrated circuit specimen using 3 MeV electrons in the transmission electron microscope [J]. Review of Scientific Instruments, 2007, 78(1): 013071.1-013071.4.

CAO Meng, ZHANG Haibo, LI Chao, et al. Effect of sample structure on reconstruction quality in computed tomography [J]. Review of Scientific Instruments, 2009, 80(2): 026104.1-026104.3.

CAO Meng, ZHANG Haibo, LÜ Yong, et al. Formation and reduction of streak artefacts in electron tomography [J]. Journal of Microscopy, 2010, 239(1): 66-71.

WANG Zhou, BOVIK A C, SHEIKH H R, et al. Image quality assessment: from error visibility to structural similarity[J]. IEEE Transactions on Image Processing, 2004, 13(4): 600-612.

杨春玲, 旷开智, 陈冠豪, 等. 基于梯度的结构相似度的图像质量评价方法 [J]. 华南理工大学学报, 2006, 34(9): 22-25.

YANG Chunling, KUANG Kaizhi, CHEN Guanhai, et al. Gradient based structural similarity for image quality assessment [J]. Journal of South China University of Technology, 2006, 34(9): 22-25.

杨超,张海波. 胶片非线性特性对电子断层摄影术成像质量的影响 [J]. 西安交通大学学报, 2005, 39(8): 832-835.

YANG Chao, ZHANG Haibo. Simulation study on effect of film nonlinearity on quality of electron tomography [J]. Journal of Xi'an Jiaotong University, 2005, 39(8): 832-835.

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