Multi-Frequency Impedance Characteristics and Deterioration State Evaluation Method of Metallized Film Capacitors

YAN Xinyi; ZHENG Linzi; XU Xinyu; XIONG Qing; ZHU Lingyu; JI Shengchang; XU Yang; CHEN Yang

doi:10.7652/xjtuxb202503015

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Multi-Frequency Impedance Characteristics and Deterioration State Evaluation Method of Metallized Film Capacitors

更新时间：2026-01-06

- Multi-Frequency Impedance Characteristics and Deterioration State Evaluation Method of Metallized Film Capacitors
- Journal of Xi’an Jiaotong University Vol. 59, Issue 3, Pages: 160-171(2025)
- 作者机构：
  
  1.西安交通大学电气工程学院， 710049，西安
  2.国家电网江苏省有限公司电力科学研究院， 211100，南京
- 作者简介：
- 基金信息：
- DOI：10.7652/xjtuxb202503015
  CLC： TM536;TM930.12
- Received：26 June 2024，
  
  Online First：28 November 2024，
  
  Published：10 March 2025
- 稿件说明：
移动端阅览
YAN Xinyi, ZHENG Linzi, XU Xinyu, et al. Multi-Frequency Impedance Characteristics and Deterioration State Evaluation Method of Metallized Film Capacitors[J]. Journal of Xi’an Jiaotong University, 2025, 59(3): 160-171.
DOI：

YAN Xinyi, ZHENG Linzi, XU Xinyu, et al. Multi-Frequency Impedance Characteristics and Deterioration State Evaluation Method of Metallized Film Capacitors[J]. Journal of Xi’an Jiaotong University, 2025, 59(3): 160-171. DOI： 10.7652/xjtuxb202503015.

摘要

为评估柔性直流输电系统中金属化膜电容器的运行状态，分析其失效原因，提出了一种利用多频阻抗特征实现金属化膜电容器健康状态评估的方法。首先，建立电容器的串并联等效模型，提取表征金属化膜电容器劣化特性参量；其次，搭建金属化膜电容器加速老化测试平台及多频阻抗测试平台，获取不同劣化状态与劣化原因的电容器样品；最后，提取金

属化膜电容器多频阻抗曲线中特征参量

、

和转折频率，对不同电容器的特征参量变化进行分析。结果表明，电容器在直流电压作用下劣化时，

1.91表征导电部分劣化加剧，

0.17及转折频率高于150 Hz表征介质部分劣化加剧。该方法不仅可以识别电容器的劣化程度，还能直观反映电容器的劣化部位及原因，对喷金不良、灌封品质差的电容器具有良好的检出效果。

Abstract

To assess the operational status of metallized film capacitors in flexible DC transmission systems and analyze their failure causes

a method for health assessment of metallized film capacitors using multi-frequency impedance characteristics is proposed. Firstly

an equivalent series-parallel equivalent model of the capacitor is established to extract characteristic parameters representing the degradation of metallized film capacitors. Secondly

a testing platform for accelerated aging of capacitors and a multi-frequency impedance testing platform for metallized film capacitors are set up to obtain capacitor samples in different degradation states due to varying degradation causes. Finally

characteristic parameters

and inflection frequency are extracted from the multi-frequency impedance curve of metallized film capacitors to analyze the changes in characteristic parameters of different capacitors. The results indicate that when capacitors deteriorate under DC voltage

1.91

it signifies an exacerbation of the conductive part degradation

and if

0.17 and the inflection frequency is higher than 150 Hz

it indicates an exacerbation of the dielectric part degradation. This method not only identifies the degree of capacitor degradation but also visually reflects the degraded parts and causes of capacitors

demonstrating good detection performance for capacitors with poor metallization

and inferior sealing quality.

关键词

Keywords

references

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