Assessing Upper Bound of ∞-Norm for Induced Load Response Across Electronic Devices Load Under the Illumination of Intentional Electromagnetic Interferences

LIANG Tao; XIE Yanzhao; XI Zhihao

doi:10.7652/xjtuxb202209017

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Assessing Upper Bound of ∞-Norm for Induced Load Response Across Electronic Devices Load Under the Illumination of Intentional Electromagnetic Interferences

更新时间：2025-07-09

- Assessing Upper Bound of ∞-Norm for Induced Load Response Across Electronic Devices Load Under the Illumination of Intentional Electromagnetic Interferences
- Vol. 56, Issue 9, Pages: 160-168(2022)
- 作者机构：
  
  1. 西安交通大学电力设备电气绝缘国家重点实验室,西安,710049
  2. 西安交通大学电气工程学院,西安,710049
- 作者简介：
- 基金信息：
- DOI：10.7652/xjtuxb202209017
  CLC： O441.4
- Online First：10 September 2022，
  
  Published：2022
- 稿件说明：
移动端阅览
LIANG Tao, XIE Yanzhao, XI Zhihao. Assessing Upper Bound of ∞-Norm for Induced Load Response Across Electronic Devices Load Under the Illumination of Intentional Electromagnetic Interferences[J]. 2022, 56(9): 160-168.
DOI：

LIANG Tao, XIE Yanzhao, XI Zhihao. Assessing Upper Bound of ∞-Norm for Induced Load Response Across Electronic Devices Load Under the Illumination of Intentional Electromagnetic Interferences[J]. 2022, 56(9): 160-168. DOI： 10.7652/xjtuxb202209017.

摘要

为量化表征有意电磁干扰(IEMI)辐照对电子设备的电磁损伤能力

本文围绕IEMI辐照下设备响应波形∞范数的上确界评定

通过构建关于时域波形变量的泛函优化问题

求解了能最大化斜率峰值及冲击峰值两类∞范数的IEMI辐射场波形

获得了范数上确界关于设备电磁耦合效率函数的解析解。研究发现

能最大化斜率峰值、冲击峰值范数的IEMI均为具有宽带脉冲波形特征

且范数上确界分别由耦合效率函数的高频、低频分量强度决定。选取了Vivaldi及对数周期两类超宽带天线作为受扰设备

通过对比分析了不同∞范数目标最优IEMI波形的时、频域特征

验证了范数定界方法具备准确性及全局最优性。研究解决了IEMI辐射波形复杂多变条件下的设备辐射抗扰度量化评估问题

完善了极端条件下的电磁安全评估理论

对于创新IEMI抗扰度试验技术及防护加固技术具有指导意义。

Abstract

To quantify the radiated susceptibility of electronic devices under illumination of intentional electromagnetic interference(IEMI)

the IEMI radiation field waveforms that can maximize both sharpness peak and impulse peak norms are identified

and the analytical solution of the efficiency function of electromagnetic coupling is obtained by assessing the upper bound of ∞-norm for induced load response across electronic devices load under illumination of IEMI and solving the functional optimization problem about time-domain waveform variables. It is found that the IEMI waveforms maximizing both sharpness peak and impulse peak norms share similar wideband pulsed characteristics

the associated upper bounds are determined by the magnitude of high-frequency and low-frequency components of coupling efficiency

respectively. In addition

ultra-wideband Vivaldi antenna and ultra-wideband log-periodic antenna are used as devices under test. The time-domain and frequency-domain characteristics of the optimal IEMI waveform are compared and analyzed for different ∞-norm targets

and the accuracy and global optimality of the proposed method are verified. The proposed method can be used to assess and quantify the radiated susceptibility of the devices in complicated and varying IEMI radiation conditions

improve the theory of electromagnetic safety assessment under extreme conditions and provide guidance for innovating IEMI radiated susceptibility testing/protection techniques.

关键词

Keywords

references

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