For the reliability assessment of complicated electronic equipment
the thimbleful testing samples and the degradation characters data recognition become the main focuses. Thus
a new approach based on accelerated degradation tests of virtual samples is proposed. Relative nearness degree is introduced for degradation dada process
and the degradation characters data are represented by the relative nearness degree
then the original samples are expanded virtually and modified
and the degradation track of electronic equipment under various stresses is obtained. Combining the traditional reliability prediction
the difficulty of thimbleful testing sample is solved in the accelerated degradation tests. Example analysis shows that the error of the life prediction of a kind of electronic equipment is 5.93% by contrast with the factory calibrating error of service life
and the predicted service life of 86.27% samples is more than nine years
which indicates validity and higher ratio of efficiency to cost of the proposed method.
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references
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