Hypergeometric Distribution Method for Testability Estimation and Demonstration

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Hypergeometric Distribution Method for Testability Estimation and Demonstration

更新时间：2025-07-09

- Hypergeometric Distribution Method for Testability Estimation and Demonstration
- Vol. 43, Issue 3, Pages: 42-45+64(2009)
- 作者机构：
  
  1. 西安交通大学电子与信息工程学院,西安,710049
  2. 军械工程学院光学与电子工程系,石家庄,050003
- 作者简介：
- 基金信息：
- DOI：
  CLC： TB114.3
- Online First：10 March 2009，
  
  Published：2009
- 稿件说明：
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Hypergeometric Distribution Method for Testability Estimation and Demonstration[J]. 2009, 43(3): 42-45+64.
DOI：

Hypergeometric Distribution Method for Testability Estimation and Demonstration[J]. 2009, 43(3): 42-45+64. DOI：

摘要

分析了现有故障检测率R

和故障隔离率R

验证方法存在的问题

改用故障检测覆盖率R

FDC

和故障隔离覆盖率R

FIC

作为测试性指标参数

提出了测试性评估与验证的超几何分布法.基于故障检测(隔离)成功数的超几何分布

利用极大似然法思想研究了R

FDC

FIC

)指标的点估计方法

利用贝叶斯公式研究了区间估计方法

并给出了测试性验证规则.仿真结果表明

与传统的二项分布法相比

对于样本总体确定情况下的测试性验证

超几何分布法的评估和验证结果更加准确

更加适应当前电子装备检测设备的特点

适用于测试性指标R

FDC

和R

FIC

的评估和验证.

Abstract

The problems in present demonstration method of fault detection rate(R

)and fault isolation rate(R

)are analyzed

and the fault detection coverage percentage(R

FDC

)and fault isolation coverage percentage(R

FIC

)are taken as the testability estimation indexes instead of R

and R

. Therefore

a new hypergeometric distribution method is proposed for testability estimation and demonstration. Based on hypergeometric distribution

the maximum likelihood estimate method is applied in point estimation

and the Bayes formula is applied for interval estimation

hence a testability demonstration rule is provided. Simulation results show that the hypergeometric distribution method is m

ore accurate than the conventional binomial distribution method for testability estimation and demonstration under certain samples. The proposed method is suitable for the estimation and demonstration of current electronic devices.

关键词

Keywords

references

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WEN Xisen, HU Zheng, YI Xiaoshan, et al. Current status and future of testability [J]. Test and Control Technology, 2000, 19(1): 9-12.

周玉芬,徐松涛,高锡俊,等.测试性验证的理论和方法研究[J].电子产品可靠性与环境试验, 1996, 37(2): 10-15.

ZHOU Yufen, XU Songtao, GAO Xijun, et al. Study on testability demonstration theory and method [J]. Reliability and Environmental Test of Electronic Product, 1996, 37(2): 10-15.

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王林书,鲍兰平,赵瑞清.概率论与数理统计[M]. 北京:科学出版社, 1999: 27,41.

汪荣鑫.数理统计[M].西安:西安交通大学出版社, 1986: 35.

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