To realize the application of piezoelectric probe to characterization and fabrication of nano-samples
a new piezoelectric cantilever was designed and fabricated. Wet anisotropic etching was used to produce nano-silicon-tip
and local piezoelectric layer was designed for the fabrication compatibilities among the probe
piezoelectric film and cantilever. A 450 μm×70 μm piezoelectric probe was tested on micro-force sensing platform. The measurement result indicates that the elastic constant of the cantilever gets 21.17 N/m
which matches the theoretic one. Moreover
a feasible process was summarized.
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references
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