Nonlinear effects between electron transmission and mass thickness on the quality of electron tomography(ET)for thick specimens are studied to improve the quality of the ET for thick specimens in transmission electron microscopy. A series of projections are produced by simulation and then used to reconstruct images based on electron transmission through the microns-thick specimens. It is found from simulation that artifacts due to nonlinearity exist in the reconstruction result. The artifacts are relevant to the gradient deviation of projection with respect to the projection position. Moreover
effects of nonlinear electron transmission in different tilt angle ranges on reconstruction quality are investigated
and it is found that increasing tilt angle can enhance the effect of nonlinearity and reduce the quality of reconstructed images.
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MIDGLEY P A, DUNIN-BORKOWSKI R E. Electron tomography and holography in materials science [J]. Nature Materials, 2009, 8(4): 271-280.
ANDERSSON B V, HERLAND A, MASICH S, et al. Imaging of the 3D nanostructure of a polymer solar cell by electron tomography [J]. Nano Letters, 2009, 9(2): 853-855.
YUAN Pei, ZHOU Xufeng, WANG Hongning, et al. Electron-tomography determination of the packing structure of macroporous ordered siliceous foams assembled from vesicles [J]. Small, 2009, 5(3): 377-382.
URBAN E, JACOB S, NEMETHOVA M, et al. Electron tomography reveals unbranched networks of actin filaments in lamellipodia [J]. Nature Cell Biology, 2010, 12(5): 429-436.
TAKAOKA A, HASEGAWA T, YOSHIDA K, et al. Microscopic tomography with ultra-HVEM and applications [J]. Ultramicroscopy, 2008, 108(3): 230-238.
KAMIOKA H, MURSHID S A, ISHIHARA Y, et al. A method for observing silver-stained osteocytes in situ in 3-μm sections using ultra-high voltage electron microscopy tomography [J]. Microscopy and Microanalysis, 2009, 15(5): 377-383.
AOYAMA K, TAKAGI T, HIRASE A, et al. STEM tomography for thick biological specimens [J]. Ultramicroscopy, 2008, 109(1): 70-80.
WANG Fang, ZHANG Haibo, CAO Meng, et al. Image quality of microns-thick specimens in the ultra-high voltage electron microscope [J]. Micron, 2010, 41(5): 490-497.
YANG Chao, ZHANG Haibo, TAKAOKA A. Quanitative relationship between transmission electron microscopy image quality and specimen tilt angle [J]. Journal of Xi'an Jiaotong University, 2003, 37(10): 1063-1066.
ZHANG Haibo, WANG Fang, TAKAOKA A. Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope [J]. Journal of Electron Microscopy, 2007, 56(2): 51-55.
FULTZ B, HOWE J M. Transmission electron microscopy and diffractometry of materials [M]. 3rd ed. Berlin, Germany: Springer, 2008.
ZHANG Haibo, ZHANG Xiangliang, WANG Yong, et al. Tomography experiment of an integrated circuit specimen using 3 MeV electrons in the transmission electron microscope [J]. Review of Scientific Instruments, 2007, 78(1): 013071.1-013071.4.
CAO Meng, ZHANG Haibo, LI Chao, et al. Effect of sample structure on reconstruction quality in computed tomography [J]. Review of Scientific Instruments, 2009, 80(2): 026104.1-026104.3.
CAO Meng, ZHANG Haibo, LÜ Yong, et al. Formation and reduction of streak artefacts in electron tomography [J]. Journal of Microscopy, 2010, 239(1): 66-71.
WANG Zhou, BOVIK A C, SHEIKH H R, et al. Image quality assessment: from error visibility to structural similarity[J]. IEEE Transactions on Image Processing, 2004, 13(4): 600-612.
YANG Chunling, KUANG Kaizhi, CHEN Guanhai, et al. Gradient based structural similarity for image quality assessment [J]. Journal of South China University of Technology, 2006, 34(9): 22-25.
YANG Chao, ZHANG Haibo. Simulation study on effect of film nonlinearity on quality of electron tomography [J]. Journal of Xi'an Jiaotong University, 2005, 39(8): 832-835.