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1.西安交通大学仪器科学与技术学院,710049,西安
2.安徽北方微电子研究院有限公司,215163,江苏苏州
Received:03 December 2025,
Revised:2026-03-18,
Accepted:26 March 2026,
移动端阅览
HOU Xiange, HUANG Yanhui, ZHOU Ming, et al. Phase-Field Analysis Method for the Reliability of High-
本文针对高
g
值微机电系统(MEMS)加速度传感器在极端冲击环境下的结构失效问题,提出了一种利用相场断裂模型的可靠性分析方法。该方法以相场断裂理论为基础,构建了包含失效形式识别、裂纹演化仿真、结构改进与再验证的可靠性分析流程。通过静力学与瞬态分析,并结合相场断裂模型,对裂纹萌生与扩展的微尺度过程进行了定量化与可视化表征,并与三维高
g
值冲击试验结果进行对比验证。在此基础上,针对扭转梁根部的高应力集中区域提出了圆角改进设计,并通过静力、瞬态再分析以及相场断裂的对比验证,完成改进方案的抗断裂性能评估。研究结果表明:扭转梁根部存在显著的应力集中现象,是裂纹萌生与扩展的主导区域,由此揭示了应力集中与裂纹演化之间的关联。所提出的梁根圆角改进设计使应力集中降低约18%,裂纹扩展延迟约40%,从而提高了传感器在高
g
值冲击工况下的抗断裂可靠性。该研究为高
g
值MEMS加速度传感器的可靠性分析供了一种解决方案。
To address structural failures in high-
g
Micro-Electro-Mechanical System(MEMS) accelerometers under extreme shocks
a reliability analysis method leveraging the phase-field fracture model is proposed. Based on phase-field fracture theory
a reliability analysis workflow encompassing failure-mode identification
crack-evolution simulation
structural improvement
and re-validation is established.
The micro-scale processes of crack initiation and propagation are characterized and visualized through static and transient analyses combined with a phase-field fracture model. The numerical results are comparatively validated against three-dimensional high-
g
shock test results. On this basis
a fillet improvement design is proposed for the high stress-concentration region at the torsion-beam root
and the fracture resistance of the improved scheme is evaluated via static and transient reanalysis together with phase-field fracture-based comparative validation. The results indicate that pronounced stress concentration at the torsion-beam root is the dominant region governing crack initiation and propagation
thereby revealing the relationship between stress concentration and crack evolution. The proposed beam-root fillet improvement has been shown to result in a reduction of approximately 18% in stress concentration
as well as an estimated 40% delay in crack propagation. These improvements enhance the sensor's fracture-resistance reliability under high-
g
impact conditions. This study proposes a viable solution for the reliability analysis of high-
g
MEMS accelerometers.
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